#methodological rigourKey methods deferred to unavailable material
Critical procedural details, including how single-layer graphene is identified from AFM data and the full Shubnikov-de Haas analysis, are deferred to supporting online material, limiting standalone reproducibility from the main text.
↳ Reference [15]; Figs. 1 and 3
#impact potentialEarly proof-of-concept device maturity
The demonstrated transistor has a modest on/off ratio of about 30, which the paper attributes to the zero-gap band structure, and no scalable fabrication route beyond mechanical exfoliation on oxidized silicon is established.
↳ Discussion (metallic transistor paragraph)
#methodological rigourLimited error quantification in main text
Mobility is reported as a range without formal uncertainty estimates, and the measured single-layer AFM height (0.8 nm versus the expected ~0.34 nm) is noted but not resolved in the main text.
↳ Results; Fig. 1C